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Reflective Index and Thin Film Thickness Measurement System
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| Payment Terms: | N/A |
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Product Details
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| Specification: | N/A |
Packaging & Delivery
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Product Description
High Quality, Competitively Priced Reflective Index and Thin Film Thickness Measurement System is intended specially for precise refractive index measurement. Based on Dual Reflectometer, this instrument allows to measure not only normal vertical reflectance, but also incident one. Besides it can be applied to measure thin film thickness. Please, contact us for specifications.
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SUPPLIER PROFILE
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| Company: | Korea Materials & Analysis Corp. | ||
| City/State | Taejeon, Korea | Country: |
Korea - Republic of 
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| Business Type: | Export - Manufacturer / Trading Company | Established: | 1996 |
| Member Since: | 2000 | Contact Person | Ms. Vinogradova |
SUPPLIER PROFILE
City/State/Country -
Taejeon, Korea
Korea - Republic of
Business Type -
Export - Manufacturer / Trading Company
Established -
1996
Member Since -
2000
Contact Person -
Ms. Vinogradova